Challenges in Signal Quality Testing
As AI and high-speed computing evolve, the demand for high-speed data transmission continues to rise. This surge in demand introduces significant challenges to maintaining signal integrity, underscoring the importance of PCIe electrical signal measurements.
PCIe Signal Quality Measurement
Extensive Measurement Effort:
Tx testing of an 8-slot (x16) server based on PCIe 5.0 involves up to 4,608 eye patterns and takes 40–41 days to complete.
Compromised Test Scope:
Industry challenges have led to a 50-80% reduction in full test coverage, significantly compromising quality assurance.
Quality Assurance Impact:
Manual testing processes increase the risks of errors.
AI/Automation Demand:
A non-compromising solution is needed to optimize both efficiency and accuracy.
Explore Our Solution
Key Component
① High Speed Lanes Switch
② Allion Test Fixture
③ Holder Structure
④ Automation Control Software
High Speed Lanes Switch
● Support up to 2×8 lanes Tx
● 40GHz bandwidth
⇒ Support PCIe 5.0/6.0
● Total loss budget is calculated
⇒ S4P file will be provided to match with spec
Allion PCIe Test Fixture
Allion PCIe test fixture supports the following form factors:
● CEM
● OCP NIC 3.0
● EDSFF E1/E3
● U.2/U.3
● M.2
More fixture details in here
Holder Structure
● Support 5 axis moving and rotation
⇒ X/Y/Z moving
⇒ Vertical rotation: 180 degrees
⇒ Horizontal rotation: 360 degrees
AEMS Hardware Introduction
Automation Control Software Features
Supports testing across different generations with automatic configuration switching
Easy selection of items and parameter modification for customized validation
Multi-threading support for faster analysis and automatic report generation
Automatic Lane Switching:
Control switch box for automatic lane switching.
Automated Test Pattern Toggle:
Control CMTS to automatically toggle test patterns.
Instrument Setup & Data Acquisition:
Control instruments to load setup files and automatically acquire/save waveforms.
Flexible Configuration Options:
Choose from various configurations for Spec. Generation, Lane No., and Preset Mode.
Simultaneous or Independent Execution:
Conversion software can run either simultaneously or independently.
Unattended Operation:
Conversion software can be executed without human intervention.
AEMS Software Introduction
What are the Benefits of AEMS
Efficiency Gains for PCIe Testing
Test Result for PCIe 5.0 CEM/OCP NIC 3.0 Tx
● PCIe 5.0 Test (CEM or OCP NIC 3.0/16 Lanes)
⇒ Transmitter Measurement (Gen1-5, All Preset Mode)
Efficiency Gains for PCIe Testing
Test Result for PCIe 5.0 CEM/OCP NIC 3.0 Tx
● PCIe 5.0 Test (CEM or OCP NIC 3.0/16 Lanes)
⇒ Transmitter Measurement (Gen1-5, All Preset Mode)
Test Result for PCIe 5.0 M.2/U.2/U.3 Tx
● PCIe 5.0 Test (M.2 or U.2 or U.3 /4 Lanes)
⇒ Transmitter Measurement (Gen1-5, All Preset Mode)
AEMS Test Performance Demonstration
Advanced PCI Express® Testing: AEMS High-Speed Lane Switch Series
The AEMS Series enables multi-lane switching with 40 GHz bandwidth, supporting up to 16 pairs of differential signals.
Challenges in Signal Quality Testing
As AI and high-speed computing evolve, the demand for high-speed data transmission continues to rise. This surge in demand introduces significant challenges to maintaining signal integrity, underscoring the importance of electrical signal measurements.
USB4 V2 (TBT5) Signal Quality Testing
Time-Consuming Port Testing:
Tx testing for each USB4 V2 port requires 7 hours to complete.
Manual Lane Switching:
Manual lane switching adds complexity and extends the testing workflow.
Complexity with Multiple Ports:
Systems with multiple USB4 V2 ports require considerable time for comprehensive testing.
Efficiency Issues Demand:
Testing a single port takes an entire day, posing a significant challenges for multi-port testing.
Explore Our Solution
Key Component
① High Speed Lanes Switch
② Automation Control Software
③ Allion USB4 V2 Microcontroller
High Speed Lanes Switch
● Support up to 4 lanes Tx
● 40GHz bandwidth
⇒ Support USB4 V2/TBT5
● Total loss budget is calculated
⇒ S4P file will be provided to match with spec
Allion USB4 V2 Microcontroller
● Supports various types of devices
⇒ Including host, device, monitor, and Active cable.
● Supports USB-IF Electrical Test Tool (ETT)
● Aligns with USB4 V2 Electrical Test Specification
● Compatible with USB4 V1 Electrical Test Specification
● Customizable with USB4 electrical automation solution
Learn More
Automation Control Software Features
Support for automated lane switching to improve operations and optimize workflow efficiency
Easy selection of items and parameter modification for customized validation
Multi-threading support for faster analysis and automatic report generation
Automatic Lane Switching:
Control switch box for automatic lane switching.
Instrument Setup & Data Acquisition:
Control instruments to load setup files and automatically acquire/save waveforms.
Flexible Configuration Options:
Select from various configurations to allow flexible testing in both standard compliance mode and with customized parameter testing.
Simultaneous or Independent Execution:
Conversion software can run either simultaneously or independently.
Unattended Operation:
Conversion software can be executed without human intervention.
What are the Benefits of AEMS
Efficiency Gains for USB4 V2 Testing
Test Result for USB4 V2 Tx
● USB4 V2 Test (4 Lanes)
⇒ Transmitter Measurement (Gen4 Only)
Advanced USB4 V2 (TBT5) Testing: AEMS High-Speed Lane Switch Series
The AEMS Series enables multi-lane switching with 40 GHz bandwidth, supporting up to 4 lanes switching.
Test Fixtures for AEMS
The AEMS Series enables multi-lane switching with 40 GHz bandwidth, supporting up to 4 lanes switching.
